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RF & µWave Measurements: For Design, Verification And Quality Control (Paper Back)

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Description

RF & μWave Measurements covers concepts, applications, and measurement techniques for widely used RF measurement parameters. The contents follow a top-down approach and are introduced within a measurement framework that provides a structure, orderliness and coherence to this vast subject.

RF & μWave Measurements covers signal properties & modulation, linear & non-linear device models, measurement techniques, plus instrument families; all with a balanced mix of theory and practical information, ample illustrations, mathematical treatment and practical examples.

The book is organized as follows:

  • Chapter 1 RF & μWave Overview
  • Chapter 2 Measurement Framework
  • Chapter 3 Measurement Insights – I
  • Chapter 4 Measurement Insights – II
  • Chapter 5 Signal Measurement & Analysis
  • Chapter 6 Signal Sources
  • Chapter 7 Network Characterization
  • Chapter 8 Measurement of Power
  • Chapter 9 Time Domain Measurements
  • Chapter 10 Measurement Solutions
  • Appendix – Smith Chart
  • Further Reading

More than 30 measurement parameters are covered that include AM-AM, sensitivity, passive intermodulation, crosstalk, isolation, harmonic distortion, gain compression, noise figure, directivity, PAE, IP2, IQ modulation, power gain, phase noise, AM-PM, phase delay, IP3, load pull, permittivity, TDR, plus many other regularly encountered by RF engineers.

Instrumentation discussion includes theory of operation, measurement principles and features for signal sourcing, signal analysis, network characterization and power measurements. Techniques for 50+ measurement scenarios are provided that cover frequency and time domain measurements. Measurement solutions are exemplified to encourage reader to build their own test solutions.

RF & μWave Measurements is a much-needed bridge between conventional textbooks and reference handbooks and is a useful desktop ready-reference for engineers, researchers, product organizations and educators. It can also be used as a text book for RF/ Microwave lab oriented courses.

Shiv Prasad Tripathy is an engineering practitioner, and provides consulting & knowledge services in the field of electronic measurements. His prior work experience includes companies like HCL Ltd., Agilent Technologies (now Keysight), Hewlett Packard and others. More information about his other books is on the author's page.

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Country of Origin:
US
Manufacturer Name:
Artech House
Manufacturer Part Number:
978-1630818413

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